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X-Ray Micro Tomography and Image Analysis as Complementary Methods for Morphological Characterization and Coating Thickness Measurement of Coated Particles

X-Ray Micro Tomography and Image Analysis as Complementary Methods for Morphological Characterization and Coating Thickness Measurement of Coated Particles, Giacomo Perfetti, Elke Van de Casteele, Bernd Rieger, Willem J. Wildeboer, and Gabrie M. H. Meesters. Advanced Powder Technology 2010, 21  (6, SI), 663–675.

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BibTeX

@article{ ISI:000285216900012,
Author = {Perfetti, Giacomo and Van de Casteele, Elke and Rieger, Bernd and Wildeboer, Willem J. and Meesters, Gabrie M. H.},
Title = {X-Ray Micro Tomography and Image Analysis as Complementary Methods for Morphological Characterization and Coating Thickness Measurement of Coated Particles},
Journal = {Advanced Powder Technology},
Year = {2010},
Volume = {21},
Number = {6, SI},
Pages = {663-675},
Month = {},
Note = {},
DOI = {10.1016/j.apt.2010.08.002},
ISSN = {0921-8831},
ORCID-Numbers = {Van de Casteele, Elke/0000-0003-0395-3002},
Times-Cited = {16},
Unique-ID = {ISI:000285216900012},
}

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